The reporting of defect coverage for board tests has previously lacked rigor and usefulness. A new process and metric was introduced at the 2002 International Test Conference [Hird02]. This paper was very positively received at ITC and subsequent venues, suggesting the concepts it defined were long overdue. However that paper, due to space limitations, did not give a comprehensive treatment to Boundary-Scan test coverage. Since Boundary-Scan testing is becoming pervasive, it is the object of this paper to fulfill this need.